TG-200 Precision Non Destructive Testing Machine Coating Thickness Tester with F and NF Measuring Probes
Application Description:
F Type Magnetic induction:
● Can measure the thickness of non-magnetic coating layers on magnetic substrate
● Such as: (aluminum, chrome, copper, enamel, rubber, paint) on magnetic substrate (steel, iron, alloy and magnetic stainless steel)
NF Type Eddy Current:
● Can measure the thickness of non conductive coating layers covered on nonferrous substrate.
● Such as: (enamel, rubber, paint, vanish, plastic anodic-oxide layer) covered on nonferrous substrate (aluminum, brass, zinc, tin and nonmagnetic stainless steel)
Features:
* Two measuring methods: magnetic induction (F) and eddy current (N)
* Two measurement mode: Single and Continuous(Notice:Continuous mode is convenient to measure the coating thickness of curved objects and tiny objects.)
* Metric/imperial system selectable.
* Manual or automatic shut down.
* Auto memory of calibration value,and auto recognize the substrate.
* Operation process have buzzing reminder,while no buzzing in continuous mode.
* Use “USB data output” and “RS-232 data output” to connect with PC.
* Provide “Bluetooth ™ data output” choice.
* Separate Type can provide several type probe, measure can be more flexibility.
Technical Specifications:
| Model | TG-200 |
| Order# | 761-106 |
| Measuring range | 0-1250um/0-50mil (default range) |
| Operating principle | Ultrasonic |
| Resolution | 0.1/1 |
| Min. radius work piece | F: Convex 1.5mm / Concave 25mm |
| N: Convex 3mm / Concave 50mm |
| Min. measuring area | 6mm |
| Min. sample thickness | 0.3mm |
| Battery indicator | low battery indicator |
| Accuracy | ±1-3%n or ±2.5um |
| Metric/ imperial | convertible |
| Power supply | 4x1.5V AAA(UM-4)battery |
| Auto switch off |
| Operating conditions | Temperature:0~45℃(32FH~104FH) |
| Humidity≤90%RH |
| Dimensions | 126x65x27mm |
| Weight | 81g(not including battery) |
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TG-200 Precision Non Destructive Testing Machine Coating Thickness Tester with F and NF Measuring Probes Images
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